Abstract
Optical modeling of aluminum back surface field (Al-BSF) and passivated emitter and rear contact (PERC) silicon wafer solar cells are extended into the infrared wavelength range (300–2500 nm). The model incorporates ray tracing to account for pyramidal texture of the front silicon surface, free carrier absorption in the front emitter; bulk silicon wafer, BSF; and Lambertian scattering at the silicon back contact. Total reflectance of pyramidal textured cells with different contact geometries with and without encapsulation are simulated. Simulated reflectance and short circuit current density match well with experimental values. These physics-based optical models serve as input for evaluating optical and thermal management strategies for silicon wafer solar cells.
Original language | American English |
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Article number | Article No. 110655 |
Number of pages | 6 |
Journal | Solar Energy Materials and Solar Cells |
Volume | 215 |
DOIs | |
State | Published - 15 Sep 2020 |
Bibliographical note
Publisher Copyright:© 2020 Elsevier B.V.
NREL Publication Number
- NREL/JA-5K00-73273
Keywords
- Infrared reflectance
- PERC cells
- Ray tracing
- Scattering
- Silicon solar cell
- Thermal management