Abstract
This paper examines the long-term performance of a 20-year-old crystalline silicon system. The degradation was found to be about 0.8%/year and is consistent with historical averages. In contrast with the majority of historical degradation, the decline for this particular system is more attributable to fill factor (FF) than to short-circuit current (Isc). The underlying cause was determined to be an increase in series resistance. We found no evidence that this system degrades significantly differently from its worst performing strings and modules. Maintenance events during the 20 years were dominated by inverter issues with a total of four replacements.
Original language | American English |
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Article number | 7042258 |
Pages (from-to) | 744-751 |
Number of pages | 8 |
Journal | IEEE Journal of Photovoltaics |
Volume | 5 |
Issue number | 3 |
DOIs | |
State | Published - 2015 |
Bibliographical note
Publisher Copyright:© 2011-2012 IEEE.
NREL Publication Number
- NREL/JA-5J00-63250
Keywords
- Degradation
- durability
- field performance
- photovoltaic system
- reliability