Abstract
As maximum device temperatures approach 200 degrees Celsius, continuous operation, sintered silver materials promise to maintain bonds at these high temperatures without excessive degradation rates. A detailed characterization of the thermal performance and reliability of sintered silver materials and processes has been initiated for the next year. Future steps in crack modeling include efforts to simulate crack propagation directly using the extended finite element method (X-FEM), a numerical technique that uses the partition of unity method for modeling discontinuities such as cracks in a system.
Original language | American English |
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Number of pages | 14 |
State | Published - 2017 |
Bibliographical note
DOE posted at: https://energy.gov/eere/vehicles/downloads/electric-drive-technologies-2016-annual-progress-reportNREL Publication Number
- NREL/MP-5400-67117
Keywords
- bonded interfaces, high-temperature packaging
- crack propagation
- power electronics
- reliability
- sintered silver
- thermal performance