Abstract
Presented at 2001 NCPV Program Review Meeting: Performed accelerated exposures to study performance reliability/materials degradation of encapsulated c-Si cells using weathering protocols in 2 weatherometers.
Original language | American English |
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Number of pages | 4 |
State | Published - 2001 |
Event | NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001 |
Conference
Conference | NCPV Program Review Meeting |
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City | Lakewood, Colorado |
Period | 14/10/01 → 17/10/01 |
NREL Publication Number
- NREL/CP-520-30841
Keywords
- EVA
- moisture
- NCPV
- photovoltaics (PV)
- weather testing