Abstract
Presented at 2001 NCPV Program Review Meeting: Performed accelerated exposures to study performance reliability/materials degradation of encapsulated c-Si cells using weathering protocols in 2 weatherometers.
| Original language | American English |
|---|---|
| Number of pages | 4 |
| State | Published - 2001 |
| Event | NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001 |
Conference
| Conference | NCPV Program Review Meeting |
|---|---|
| City | Lakewood, Colorado |
| Period | 14/10/01 → 17/10/01 |
NLR Publication Number
- NREL/CP-520-30841
Keywords
- EVA
- moisture
- NCPV
- photovoltaics (PV)
- weather testing