Abstract
This paper presents a combination of numerical and experimental methods used to characterize defect clusters in multicrystalline silicon solar cells.
Original language | American English |
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Number of pages | 13 |
State | Published - 2009 |
Event | Semicon China 2009 - Shanghai, China Duration: 17 Mar 2009 → 19 Mar 2009 |
Conference
Conference | Semicon China 2009 |
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City | Shanghai, China |
Period | 17/03/09 → 19/03/09 |
NREL Publication Number
- NREL/CP-520-45012
Keywords
- dark saturation current
- defect clusters
- grain orientation
- minority-carrier lifetimes
- multicrystalline silicon
- photogenerated current density
- PV
- solar cells