Performance of Ferroelectric Based Tunable Capacitors as a Function of Electrode Geometry

T. V. Rivkin, C. M. Carlson, P. A. Parilla, D. S. Ginley

Research output: Contribution to journalArticlepeer-review

5 Scopus Citations


High quality Ba0.4Sr0.6TiO3 and SrTiO3 films were grown by Pulsed Laser Deposition on single crystal LaAlO3 and MgO substrates. Temperature dependencies of the dielectric constant and loss tangent of the films were studied using planar interdigitated test capacitors with various electrode geometries. The temperature where the maximum or "peak" capacitance occurs (Tp and referred to as the "peak temperature") is found to depend on the electrode geometry in these films. As much as 40 K difference in Tp was observed between the STO test capacitors with 5 μm and 40 μm gaps between electrodes. Interface built-in electric field and metal-ferroelectric thermal mismatch strain are considered as possible explanation of the effect of electrode geometry on peak temperature of the capacitors.

Original languageAmerican English
Pages (from-to)215-223
Number of pages9
JournalIntegrated Ferroelectrics
Issue number3-4
StatePublished - 2000

NREL Publication Number

  • NREL/JA-520-30989


  • BST
  • Electrodes
  • Microwave
  • Strain
  • Transition temperature


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