Performance Test of Amorphous Silicon Modules in Different Climates - Year Four: Progress in Understanding Exposure History Stabilization Effects; Preprint

Performance Test of Amorphous Silicon Modules in Different Climates - Year Four: Progress in Understanding Exposure History Stabilization Effects; Preprint

Research output: Contribution to conference › Paper

Abstract

The four-year experiment involved three identical sets of thin-film a-Si modules from various manufacturers deployed outdoors simultaneously in three sites with distinct climates. Each PV module set spent a one-year period at each site before a final period at the original site where it was first deployed.

Original language	American English
Number of pages	8
State	Published - 2008
Event	33rd IEEE Photovoltaic Specialists Conference - San Diego, California Duration: 11 May 2008 → 16 May 2008

Conference

Conference	33rd IEEE Photovoltaic Specialists Conference
City	San Diego, California
Period	11/05/08 → 16/05/08

NREL Publication Number

NREL/CP-520-42523

Keywords

amorphous silicon
coefficients of efficiency
fill factor
light-induced degradation
modules
open-circuit voltages
PV
Staebler-Wronski effect
thin films

Access to Document

https://www.nrel.gov/docs/fy08osti/42523.pdf

Cite this

@conference{0158e7fd772748e89ed2dffc458af69d,

title = "Performance Test of Amorphous Silicon Modules in Different Climates - Year Four: Progress in Understanding Exposure History Stabilization Effects; Preprint",

abstract = "The four-year experiment involved three identical sets of thin-film a-Si modules from various manufacturers deployed outdoors simultaneously in three sites with distinct climates. Each PV module set spent a one-year period at each site before a final period at the original site where it was first deployed.",

keywords = "amorphous silicon, coefficients of efficiency, fill factor, light-induced degradation, modules, open-circuit voltages, PV, Staebler-Wronski effect, thin films",

author = "NREL",

year = "2008",

language = "American English",

note = "33rd IEEE Photovoltaic Specialists Conference ; Conference date: 11-05-2008 Through 16-05-2008",

}

TY - CONF

T1 - Performance Test of Amorphous Silicon Modules in Different Climates - Year Four: Progress in Understanding Exposure History Stabilization Effects; Preprint

AU - NREL, null

PY - 2008

Y1 - 2008

N2 - The four-year experiment involved three identical sets of thin-film a-Si modules from various manufacturers deployed outdoors simultaneously in three sites with distinct climates. Each PV module set spent a one-year period at each site before a final period at the original site where it was first deployed.

AB - The four-year experiment involved three identical sets of thin-film a-Si modules from various manufacturers deployed outdoors simultaneously in three sites with distinct climates. Each PV module set spent a one-year period at each site before a final period at the original site where it was first deployed.

KW - amorphous silicon

KW - coefficients of efficiency

KW - fill factor

KW - light-induced degradation

KW - modules

KW - open-circuit voltages

KW - PV

KW - Staebler-Wronski effect

KW - thin films

M3 - Paper

T2 - 33rd IEEE Photovoltaic Specialists Conference

Y2 - 11 May 2008 through 16 May 2008

ER -

Performance Test of Amorphous Silicon Modules in Different Climates - Year Four: Progress in Understanding Exposure History Stabilization Effects; Preprint

Abstract

Conference

NREL Publication Number

Keywords

Access to Document

Fingerprint

Cite this