Photoconductive Decay Lifetime and Suns-Voc Diagnostics of Efficient Heterojunction Solar Cells: Preprint

Matthew Page

Photoconductive Decay Lifetime and Suns-Voc Diagnostics of Efficient Heterojunction Solar Cells: Preprint

Chemistry and Nanoscience

Research output: Contribution to conference › Paper

Abstract

We report results of minority carrier lifetime measurements for double-sided p-type Si heterojunction devices and compare Suns-Voc results to Light I-V measurements on 1 cm2 solar cell devices measured on an AM1.5 calibrated XT-10 solar simulator.

Original language	American English
Number of pages	7
State	Published - 2008
Event	33rd IEEE Photovoltaic Specialists Conference - San Diego, California Duration: 11 May 2008 → 16 May 2008

Conference

Conference	33rd IEEE Photovoltaic Specialists Conference
City	San Diego, California
Period	11/05/08 → 16/05/08

NREL Publication Number

NREL/CP-520-42564

Keywords

devices
hot-wire chemical vapor deposition (HWCVD)
indium tin oxide
minority-carrier lifetimes
photoconductive
PV
SHJ
silicon heterojunction
solar cells
transparent conducting oxides (TCO)

Access to Document

https://www.nrel.gov/docs/fy08osti/42564.pdf

Cite this

@conference{1e8b1403eda64310bfaa964199692271,

title = "Photoconductive Decay Lifetime and Suns-Voc Diagnostics of Efficient Heterojunction Solar Cells: Preprint",

abstract = "We report results of minority carrier lifetime measurements for double-sided p-type Si heterojunction devices and compare Suns-Voc results to Light I-V measurements on 1 cm2 solar cell devices measured on an AM1.5 calibrated XT-10 solar simulator.",

keywords = "devices, hot-wire chemical vapor deposition (HWCVD), indium tin oxide, minority-carrier lifetimes, photoconductive, PV, SHJ, silicon heterojunction, solar cells, transparent conducting oxides (TCO)",

author = "Matthew Page",

year = "2008",

language = "American English",

note = "33rd IEEE Photovoltaic Specialists Conference ; Conference date: 11-05-2008 Through 16-05-2008",

}

TY - CONF

T1 - Photoconductive Decay Lifetime and Suns-Voc Diagnostics of Efficient Heterojunction Solar Cells: Preprint

AU - Page, Matthew

PY - 2008

Y1 - 2008

N2 - We report results of minority carrier lifetime measurements for double-sided p-type Si heterojunction devices and compare Suns-Voc results to Light I-V measurements on 1 cm2 solar cell devices measured on an AM1.5 calibrated XT-10 solar simulator.

AB - We report results of minority carrier lifetime measurements for double-sided p-type Si heterojunction devices and compare Suns-Voc results to Light I-V measurements on 1 cm2 solar cell devices measured on an AM1.5 calibrated XT-10 solar simulator.

KW - devices

KW - hot-wire chemical vapor deposition (HWCVD)

KW - indium tin oxide

KW - minority-carrier lifetimes

KW - photoconductive

KW - PV

KW - SHJ

KW - silicon heterojunction

KW - solar cells

KW - transparent conducting oxides (TCO)

M3 - Paper

T2 - 33rd IEEE Photovoltaic Specialists Conference

Y2 - 11 May 2008 through 16 May 2008

ER -

Photoconductive Decay Lifetime and Suns-Voc Diagnostics of Efficient Heterojunction Solar Cells: Preprint

Abstract

Conference

NREL Publication Number

Keywords

Access to Document

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Cite this