Photoreflectance Characterization of CdTe Thin Films Grown by Molecular Beam Epitaxy on GaAs(100)

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	219-222
Number of pages	4
Journal	Applied Physics A Solids and Surfaces
Volume	58
Issue number	3
DOIs	https://doi.org/10.1007/BF00324379
State	Published - 1994

NREL Publication Number

@article{4e229952697c4e2ea6ba52c79977b4f8,

title = "Photoreflectance Characterization of CdTe Thin Films Grown by Molecular Beam Epitaxy on GaAs(100)",

author = "NREL",

year = "1994",

doi = "10.1007/BF00324379",

language = "American English",

volume = "58",

pages = "219--222",

journal = "Applied Physics A Solids and Surfaces",

issn = "0721-7250",

publisher = "Springer Verlag",

number = "3",

}