Abstract
Presented at the 2001 NCPV Program Review Meeting: Study of photothermal stability of special EVA encapsulant by accelerated exposure testing and analysis of causes of performance degradation on a-Si modules.
Original language | American English |
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Number of pages | 4 |
State | Published - 2001 |
Event | NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001 |
Conference
Conference | NCPV Program Review Meeting |
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City | Lakewood, Colorado |
Period | 14/10/01 → 17/10/01 |
NREL Publication Number
- NREL/CP-520-31026
Keywords
- a-Si
- degradation
- encapsulants
- ethylene vinyl acetate
- EVA
- EVA
- NCPV
- photothermal stability
- photovoltaics (PV)