Abstract
Presented at the 2001 NCPV Program Review Meeting: Study of photothermal stability of special EVA encapsulant by accelerated exposure testing and analysis of causes of performance degradation on a-Si modules.
| Original language | American English |
|---|---|
| Number of pages | 4 |
| State | Published - 2001 |
| Event | NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001 |
Conference
| Conference | NCPV Program Review Meeting |
|---|---|
| City | Lakewood, Colorado |
| Period | 14/10/01 → 17/10/01 |
NLR Publication Number
- NREL/CP-520-31026
Keywords
- a-Si
- degradation
- encapsulants
- ethylene vinyl acetate
- EVA
- EVA
- NCPV
- photothermal stability
- photovoltaics (PV)