Photothermal Stability of Various Module Encapsulants and Effects of Superstrate and Substrate Materials Studied for PVMaT Sources

Photothermal Stability of Various Module Encapsulants and Effects of Superstrate and Substrate Materials Studied for PVMaT Sources

Research output: Contribution to conference › Paper

Abstract

This paper briefs the photothermal reliability studies we conducted on different encapsulation materials for some U.S. PV companies that are subcontractors of the Photovoltaic Manufacturing Technology (PVMaT) program.

Original language	American English
Pages	67-68
Number of pages	2
State	Published - 2000
Event	Program and NCPV Program Review Meeting 2000 - Denver, Colorado Duration: 16 Apr 2000 → 19 Apr 2000

Conference

Conference	Program and NCPV Program Review Meeting 2000
City	Denver, Colorado
Period	16/04/00 → 19/04/00

NREL Publication Number

NREL/CP-520-28078

Keywords

amorphous Si
applications
cadmium telluride (CdTe) photovoltaic solar cells modules
components
concentrators
copper indium diselenide (CIS)
crystalline silicon (x-Si) (c-Si)
manufacturing
markets
NCPV
photovoltaics (PV)
research and development (R&D)
systems
systems integration
thin films

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

https://www.nrel.gov/docs/fy00osti/28078.pdf

Cite this

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title = "Photothermal Stability of Various Module Encapsulants and Effects of Superstrate and Substrate Materials Studied for PVMaT Sources",

abstract = "This paper briefs the photothermal reliability studies we conducted on different encapsulation materials for some U.S. PV companies that are subcontractors of the Photovoltaic Manufacturing Technology (PVMaT) program.",

keywords = "amorphous Si, applications, cadmium telluride (CdTe) photovoltaic solar cells modules, components, concentrators, copper indium diselenide (CIS), crystalline silicon (x-Si) (c-Si), manufacturing, markets, NCPV, photovoltaics (PV), research and development (R&D), systems, systems integration, thin films",

author = "NREL",

year = "2000",

language = "American English",

pages = "67--68",

note = "Program and NCPV Program Review Meeting 2000 ; Conference date: 16-04-2000 Through 19-04-2000",

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TY - CONF

T1 - Photothermal Stability of Various Module Encapsulants and Effects of Superstrate and Substrate Materials Studied for PVMaT Sources

AU - NREL, null

PY - 2000

Y1 - 2000

N2 - This paper briefs the photothermal reliability studies we conducted on different encapsulation materials for some U.S. PV companies that are subcontractors of the Photovoltaic Manufacturing Technology (PVMaT) program.

AB - This paper briefs the photothermal reliability studies we conducted on different encapsulation materials for some U.S. PV companies that are subcontractors of the Photovoltaic Manufacturing Technology (PVMaT) program.

KW - amorphous Si

KW - applications

KW - cadmium telluride (CdTe) photovoltaic solar cells modules

KW - components

KW - concentrators

KW - copper indium diselenide (CIS)

KW - crystalline silicon (x-Si) (c-Si)

KW - manufacturing

KW - markets

KW - NCPV

KW - photovoltaics (PV)

KW - research and development (R&D)

KW - systems

KW - systems integration

KW - thin films

M3 - Paper

SP - 67

EP - 68

T2 - Program and NCPV Program Review Meeting 2000

Y2 - 16 April 2000 through 19 April 2000

ER -

Photothermal Stability of Various Module Encapsulants and Effects of Superstrate and Substrate Materials Studied for PVMaT Sources

Abstract

Conference

NREL Publication Number

Keywords

UN SDGs

Access to Document

Fingerprint

Cite this