Photovoltaic Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design

Michael Kempe; Andrew Fairbrother; Julien Avenet; Yadong Liu; Matt Boyd; Scott Julien; Kai-Tak Wan; Liang Ji; Christopher Flueckiger; Sebastien Merzlic; Amy Lefebvre; Greg O’Brien; Yu Wang; Laura Bruckman; Roger French; Brian Dougherty; Xiaohong Gu

doi:10.1109/PVSC.2017.8366256

Photovoltaic Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design

Michael Kempe, Andrew Fairbrother, Julien Avenet, Yadong Liu, Matt Boyd, Scott Julien, Kai-Tak Wan, Liang Ji, Christopher Flueckiger, Sebastien Merzlic, Amy Lefebvre, Greg O’Brien, Yu Wang, Laura Bruckman, Roger French, Brian Dougherty, Xiaohong Gu

Materials Science

Research output: Contribution to conference › Paper

3 Scopus Citations

Abstract

Backsheet exposure conditions and degradation are shown to vary significantly within an array. This is demonstrated by a survey of the NIST ground-mounted photovoltaic array, which is comprised of over 1000 modules of a single brand with a polyester-based backsheet. Site and array design factors are found to have significant effects on the exposure conditions, and thus degradation of the backsheets. Irradiance is found to be the most significant exposure factor which varies within the array.

Original language	American English
Pages	1933-1936
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2017.8366256
State	Published - 2018
Event	2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) - Washington, D.C. Duration: 25 Jun 2017 → 30 Jun 2017

Conference

Conference	2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
City	Washington, D.C.
Period	25/06/17 → 30/06/17

NREL Publication Number

NREL/CP-5K00-68788

Keywords

array design
backsheet
degradation
exposure conditions
PEN
photovoltaic array
reliability

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10.1109/PVSC.2017.8366256

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Kempe, M., Fairbrother, A., Avenet, J., Liu, Y., Boyd, M., Julien, S., Wan, K.-T., Ji, L., Flueckiger, C., Merzlic, S., Lefebvre, A., O’Brien, G., Wang, Y., Bruckman, L., French, R., Dougherty, B., & Gu, X. (2018). Photovoltaic Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design. 1933-1936. Paper presented at 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), Washington, D.C.. https://doi.org/10.1109/PVSC.2017.8366256

@conference{1016704b5bee409596ff1483e5e669ee,

title = "Photovoltaic Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design",

abstract = "Backsheet exposure conditions and degradation are shown to vary significantly within an array. This is demonstrated by a survey of the NIST ground-mounted photovoltaic array, which is comprised of over 1000 modules of a single brand with a polyester-based backsheet. Site and array design factors are found to have significant effects on the exposure conditions, and thus degradation of the backsheets. Irradiance is found to be the most significant exposure factor which varies within the array.",

keywords = "array design, backsheet, degradation, exposure conditions, PEN, photovoltaic array, reliability",

author = "Michael Kempe and Andrew Fairbrother and Julien Avenet and Yadong Liu and Matt Boyd and Scott Julien and Kai-Tak Wan and Liang Ji and Christopher Flueckiger and Sebastien Merzlic and Amy Lefebvre and Greg O{\textquoteright}Brien and Yu Wang and Laura Bruckman and Roger French and Brian Dougherty and Xiaohong Gu",

year = "2018",

doi = "10.1109/PVSC.2017.8366256",

language = "American English",

pages = "1933--1936",

note = "2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) ; Conference date: 25-06-2017 Through 30-06-2017",

}

Kempe, M, Fairbrother, A, Avenet, J, Liu, Y, Boyd, M, Julien, S, Wan, K-T, Ji, L, Flueckiger, C, Merzlic, S, Lefebvre, A, O’Brien, G, Wang, Y, Bruckman, L, French, R, Dougherty, B & Gu, X 2018, 'Photovoltaic Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design', Paper presented at 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), Washington, D.C., 25/06/17 - 30/06/17 pp. 1933-1936. https://doi.org/10.1109/PVSC.2017.8366256

TY - CONF

T1 - Photovoltaic Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design

AU - Kempe, Michael

AU - Fairbrother, Andrew

AU - Avenet, Julien

AU - Liu, Yadong

AU - Boyd, Matt

AU - Julien, Scott

AU - Wan, Kai-Tak

AU - Ji, Liang

AU - Flueckiger, Christopher

AU - Merzlic, Sebastien

AU - Lefebvre, Amy

AU - O’Brien, Greg

AU - Wang, Yu

AU - Bruckman, Laura

AU - French, Roger

AU - Dougherty, Brian

AU - Gu, Xiaohong

PY - 2018

Y1 - 2018

N2 - Backsheet exposure conditions and degradation are shown to vary significantly within an array. This is demonstrated by a survey of the NIST ground-mounted photovoltaic array, which is comprised of over 1000 modules of a single brand with a polyester-based backsheet. Site and array design factors are found to have significant effects on the exposure conditions, and thus degradation of the backsheets. Irradiance is found to be the most significant exposure factor which varies within the array.

AB - Backsheet exposure conditions and degradation are shown to vary significantly within an array. This is demonstrated by a survey of the NIST ground-mounted photovoltaic array, which is comprised of over 1000 modules of a single brand with a polyester-based backsheet. Site and array design factors are found to have significant effects on the exposure conditions, and thus degradation of the backsheets. Irradiance is found to be the most significant exposure factor which varies within the array.

KW - array design

KW - backsheet

KW - degradation

KW - exposure conditions

KW - PEN

KW - photovoltaic array

KW - reliability

U2 - 10.1109/PVSC.2017.8366256

DO - 10.1109/PVSC.2017.8366256

M3 - Paper

SP - 1933

EP - 1936

T2 - 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)

Y2 - 25 June 2017 through 30 June 2017

ER -

Photovoltaic Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design

Abstract

Conference

NREL Publication Number

Keywords

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