Photovoltaics Characterization: Beyond the Horizon

This paper examines current photovoltaic test, measurement, and characterization techniques and makes evaluations and predictions of the next-generation technologies needed to meet the evolving requirements of photovoltaics. The range of support and research areas, from array through atomic-level analysis, are cited. The specific requirements of research and manufacturing sectors are addressed,including the need for more rapid response, new and photovoltaic-specific measurement techniques, manufacturing-environment measurement capabilities, and electronic-based centralized facilities. The integration and cohesion of analytical services with the evolving capabilities of the information highway are discussed and anticipated. To ensure the security of both intellectual and productproperty, the increased demands of protection of data are emphasized. Trends toward greater accuracy, precision, smaller- and larger-area analysis, and more-versatile measurement technologies are discussed.