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Physical and Numerical Modeling of Impurity Gettering in Silicon
NREL
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Dive into the research topics of 'Physical and Numerical Modeling of Impurity Gettering in Silicon'. Together they form a unique fingerprint.
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Engineering
Numerical Modeling
100%
Physical Modeling
100%
Si Device
50%
Reasonable Time
50%
Active Region
50%
Time at Temperature
50%
Material Science
Silicon
100%
Gettering
100%
Point Defect
12%