Physical Characterization of Thin-Film Solar Cells

Ken Durose; Sally E. Asher; Wolfram Jaegermann; Dean Levi; Brian E. McCandless; Wyatt Metzger; Helio Moutinho; P. D. Paulson; Craig L. Perkins; James R. Sites; Glenn Teeter; Mathias Terheggen

doi:10.1002/pip.542

Physical Characterization of Thin-Film Solar Cells

Ken Durose, Sally E. Asher, Wolfram Jaegermann, Dean Levi, Brian E. McCandless, Wyatt Metzger, Helio Moutinho, P. D. Paulson, Craig L. Perkins, James R. Sites, Glenn Teeter, Mathias Terheggen

Materials Science

Research output: Contribution to journal › Article › peer-review

79 Scopus Citations

Abstract

The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.

Original language	American English
Pages (from-to)	177-217
Number of pages	41
Journal	Progress in Photovoltaics: Research and Applications
Volume	12
Issue number	2-3
DOIs	https://doi.org/10.1002/pip.542 https://doi.org/10.1002/pip.542
State	Published - 2004

NREL Publication Number

NREL/JA-520-36458

Keywords

Characterization
Chemical analysis
Microstructure
Optical properties
Spatially resolved functionality
Thin-film solar cell

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title = "Physical Characterization of Thin-Film Solar Cells",

abstract = "The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.",

keywords = "Characterization, Chemical analysis, Microstructure, Optical properties, Spatially resolved functionality, Thin-film solar cell",

author = "Ken Durose and Asher, {Sally E.} and Wolfram Jaegermann and Dean Levi and McCandless, {Brian E.} and Wyatt Metzger and Helio Moutinho and Paulson, {P. D.} and Perkins, {Craig L.} and Sites, {James R.} and Glenn Teeter and Mathias Terheggen",

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language = "American English",

volume = "12",

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publisher = "John Wiley and Sons Ltd",

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TY - JOUR

T1 - Physical Characterization of Thin-Film Solar Cells

AU - Durose, Ken

AU - Asher, Sally E.

AU - Jaegermann, Wolfram

AU - Levi, Dean

AU - McCandless, Brian E.

AU - Metzger, Wyatt

AU - Moutinho, Helio

AU - Paulson, P. D.

AU - Perkins, Craig L.

AU - Sites, James R.

AU - Teeter, Glenn

AU - Terheggen, Mathias

PY - 2004

Y1 - 2004

N2 - The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.

AB - The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.

KW - Characterization

KW - Chemical analysis

KW - Microstructure

KW - Optical properties

KW - Spatially resolved functionality

KW - Thin-film solar cell

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U2 - 10.1002/pip.542

DO - 10.1002/pip.542

M3 - Article

AN - SCOPUS:1842628556

SN - 1062-7995

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SP - 177

EP - 217

JO - Progress in Photovoltaics: Research and Applications

JF - Progress in Photovoltaics: Research and Applications

IS - 2-3

ER -

Physical Characterization of Thin-Film Solar Cells

Abstract

NREL Publication Number

Keywords

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