Abstract
Flexible polymer substrates coated with inorganic oxide moisture barriers are a potential replacement for glass backsheets in thin film PV modules. Silicon oxynitride (SiOxNy) deposited by PECVD on polyethylene terephthalate (PET) represents one potential new backsheet candidate. Barrier deposition runs at NREL have typically included a nitrogen-rich plasma pretreatment prior to actual barrierdeposition with the intention of cleaning the PET surface as well as enhancing adhesion of the SiOxNy barrier film to PET; however, test coupons of PET/barrier/EVA/TPE failed after damp heat exposure. PET substrates exposed to plasma conditions similar to those used in pre-treatment were examined by X-ray photoelectron spectroscopy (XPS) to reveal new low molecular weight PET fragments arecreated which are volatile upon heating and water soluble. Failure analysis of the coupons determined that the moisture barrier is, in fact, transferred to the encapsulant side.
Original language | American English |
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Number of pages | 6 |
State | Published - 2005 |
Event | 2005 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado Duration: 7 Nov 2005 → 10 Nov 2005 |
Conference
Conference | 2005 DOE Solar Energy Technologies Program Review Meeting |
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City | Denver, Colorado |
Period | 7/11/05 → 10/11/05 |
Bibliographical note
Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102006-2245; NREL/CD-520-38557)NREL Publication Number
- NREL/CP-520-38965
Keywords
- NREL
- photovoltaics (PV)
- plasma
- polymer substrates
- PV
- solar