Polarization-Dependent XAFS Measurements of Spontaneous Ordering in MOCVD-Grown Ga0.5In0.5P on GaAs Substrates

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	404-406
Number of pages	3
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	32
Issue number	Suppl. 32-2
DOIs	https://doi.org/10.7567/JJAPS.32S2.404
State	Published - 1993

NLR Publication Number

@article{b2055c691c2b451cab90ed37abad089d,

title = "Polarization-Dependent XAFS Measurements of Spontaneous Ordering in MOCVD-Grown Ga0.5In0.5P on GaAs Substrates",

author = "NREL",

year = "1993",

doi = "10.7567/JJAPS.32S2.404",

language = "American English",

volume = "32",

pages = "404--406",

journal = "Japanese Journal of Applied Physics, Part 2: Letters",

issn = "0021-4922",

publisher = "Institute of Physics",

number = "Suppl. 32-2",

}

TY - JOUR

T1 - Polarization-Dependent XAFS Measurements of Spontaneous Ordering in MOCVD-Grown Ga0.5In0.5P on GaAs Substrates

AU - NREL, null

PY - 1993

Y1 - 1993

U2 - 10.7567/JJAPS.32S2.404

DO - 10.7567/JJAPS.32S2.404

M3 - Article

SN - 0021-4922

VL - 32

SP - 404

EP - 406

JO - Japanese Journal of Applied Physics, Part 2: Letters

JF - Japanese Journal of Applied Physics, Part 2: Letters

IS - Suppl. 32-2

ER -