Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module

Farrukh Mahmood, Fang Li, Peter Hacke, Cecile Molto, Hubert Siegneur, GovindaSamy TamizhMani

Research output: Contribution to conferencePaper


Potential induced degradation of the polarization type (PID-p) can reduce module performance in a relatively short period of time. PID-p can occur at both voltage polarities, but most studies are focused on degradation under a negative bias. This paper uses commercial bifacial passivated emitter and rear contact (PERC) cells within a monofacial glass-backsheet module construction to evaluate the impact of PID-p under a positive bias on the front side. Using the aluminum-foil (Al-foil) method, the module was stressed for PID in an environmental chamber. After the stress, the maximum power (Pmax) showed a decline of 3.1% at 1000 W/m2 and 6.2% at 200 W/m2. Recovery under light was also investigated. Complete recovery was observed at high irradiance, while a partial recovery was seen at lower irradiance. The outcomes of this study can help in understanding PID-p degradation under a positive bias and its recovery under the light.
Original languageAmerican English
Number of pages3
StatePublished - 2023
Event50th IEEE Photovoltaic Specialists Conference (PVSC 50) - San Juan, Puerto Rico
Duration: 11 Jun 202316 Jun 2023


Conference50th IEEE Photovoltaic Specialists Conference (PVSC 50)
CitySan Juan, Puerto Rico

Bibliographical note

See NREL/CP-5K00-86992 for preprint

NREL Publication Number

  • NREL/CP-5K00-88874


  • PERC
  • polarization
  • positive bias
  • potential induced degradation
  • recovery


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