Polycrystalline Thin Film Device Degradation Studies

    Research output: Contribution to conferencePaper


    Oxygen during vapor CdCl2 (VCC) treatments significantly reduced resistive shunts observed in CdS/CdTe polycrystalline devices using thinner CdS layers during 100 deg C, open-circuit, 1-sun accelerated stress testing. Cu oxidation resulting from the reduction of various trace oxides present in as-grown and VCC treated films is the proposed mechanism by which Cu diffusion, and subsequent shuntsare controlled. Graphite paste layers between metallization and CdTe behave like diffusion barriers and similarly benefit device stability. Ni-based contacts form a protective Ni2Te3 intermetallic layer that reduces metal diffusion but degrades performance through increased series resistance.
    Original languageAmerican English
    Number of pages5
    StatePublished - 2005
    Event2005 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado
    Duration: 7 Nov 200510 Nov 2005


    Conference2005 DOE Solar Energy Technologies Program Review Meeting
    CityDenver, Colorado

    Bibliographical note

    Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102006-2245; NREL/CD-520-38557)

    NREL Publication Number

    • NREL/CP-520-39003


    • NREL
    • photovoltaics (PV)
    • polycrystalline
    • PV
    • solar
    • thin films


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