@misc{f61cf882788e490d9b4f47ac89b3e05e,
title = "Polycrystalline Thin Film Solar Cell Durability: Stress Testing, Measurements, and Diagnostics (Presentation)",
abstract = "Invited Tutorial presented as part of AMS International Short Course Series.",
keywords = "accelerated lifetime testing, cadmium telluride photovoltaic, CdTe, failure analysis, modules, polycrystalline thin film, reliability, solar cells",
author = "David Albin",
year = "2010",
language = "American English",
series = "Presented at the 36th International Symposium for Testing and Failure Analysis Conference, 14-18 November 2010, Dallas, Texas",
type = "Other",
}
