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Power Electronics Materials and Bonded Interfaces - Reliability and Lifetime
Paul Paret
, Joshua Major
, Douglas DeVoto
,
Sreekant Narumanchi
Center for Integrated Mobility Sciences
Research output
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NLR
›
Poster
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Dive into the research topics of 'Power Electronics Materials and Bonded Interfaces - Reliability and Lifetime'. Together they form a unique fingerprint.
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Engineering
Power Electronics
100%
Material Interface
100%
Bonded Interface
100%
Band Gap
100%
Automotives
50%
Transients
50%
Conducted Experiment
50%
Temperature Limit
50%
Semiconductor Device
50%
Joints (Structural Components)
50%
Crack Propagation
50%
Propagation Model
50%
Liquid Phase
50%
Failure Mechanism
50%
Thermal Load
50%
Material Science
Thermal Cycling
100%
Silver
100%
Solder Joint
100%
Semiconductor Device
100%
Electronic Materials
100%
Thermal Loads
100%
Crack Propagation
100%
Refractory Material
100%