Preparation and Properties of Evaporated CdTe Films Compared with Single-Crystal CdTe: Progress Report No. 5; November 1, 1981 - January 31, 1982

    Research output: NRELSubcontract Report

    Abstract

    The hot-wall vacuum evaporator system has been put into use with successful deposition of seven thin films of n-type CdTe on glass. Microprobe analysis indicated that the films were stoichiometric CdTe. Optical transmission showed a well-defined absorption edge. Film resistivities on glass were reduced from 1.7 x 10^8 ohm-cm to 6 x 10^4 ohm-cm by In doping; film resistivities under AM1.5illumination are 2.0 x 10^4 and 5 x 10^2 ohm-cm respectively compared to the dark values given above. All the features of the system seem encouraging. A detailed summary of absorption constant vs wavelength data for CdTe has been assembled for both single crystal and thin film materials. The absorption constant for thin film material appears to vary from 2 x 10^4 cm^-1 at 8000A to 10^5 cm^-1 at5000A; single crystal values may be slightly higher.
    Original languageAmerican English
    Number of pages17
    StatePublished - 1982

    Bibliographical note

    Work performed by Department of Materials Science and Engineering, Stanford University, Stanford, California

    NREL Publication Number

    • SERI/PR-9330-1-T5

    Other Report Number

    • SERI/PR-9330-1-T5

    Keywords

    • CdTe films single-crystal
    • evaporated
    • hot-wall vacuum evaporator
    • solar

    Fingerprint

    Dive into the research topics of 'Preparation and Properties of Evaporated CdTe Films Compared with Single-Crystal CdTe: Progress Report No. 5; November 1, 1981 - January 31, 1982'. Together they form a unique fingerprint.

    Cite this