Principles and Applications of Reflectometery in PV Manufacturing: Preprint

Research output: Contribution to conferencePaper

Abstract

Presented at the 2001 NCPV Program Review Meeting: Principles, system config, and applications of new reflectometer are described. System can be used for rapid measurement of physical parameters of solar cells in commercial production.
Original languageAmerican English
Number of pages4
StatePublished - 2001
EventNCPV Program Review Meeting - Lakewood, Colorado
Duration: 14 Oct 200117 Oct 2001

Conference

ConferenceNCPV Program Review Meeting
CityLakewood, Colorado
Period14/10/0117/10/01

NREL Publication Number

  • NREL/CP-520-31003

Keywords

  • applications
  • commercial
  • principles
  • PV
  • rapid measurement
  • reflectometer
  • system configuration

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