Principles and Applications of Reflectometery in PV Manufacturing: Preprint

Research output: Contribution to conferencePaper


Presented at the 2001 NCPV Program Review Meeting: Principles, system config, and applications of new reflectometer are described. System can be used for rapid measurement of physical parameters of solar cells in commercial production.
Original languageAmerican English
Number of pages4
StatePublished - 2001
EventNCPV Program Review Meeting - Lakewood, Colorado
Duration: 14 Oct 200117 Oct 2001


ConferenceNCPV Program Review Meeting
CityLakewood, Colorado

NREL Publication Number

  • NREL/CP-520-31003


  • applications
  • commercial
  • principles
  • PV
  • rapid measurement
  • reflectometer
  • system configuration


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