Probing Carrier Depletion on Grain Boundaries in Polycrystalline Si Thin Films by Scanning Capacitance Microscopy: Paper No. 1066-A04-02

Chun Sheng Jiang

Probing Carrier Depletion on Grain Boundaries in Polycrystalline Si Thin Films by Scanning Capacitance Microscopy: Paper No. 1066-A04-02

Materials Science

Research output: Contribution to conference › Paper

Original language	American English
Pages	87-92
Number of pages	6
State	Published - 2008
Event	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2008: Materials Research Society Symposium - San Francisco, California Duration: 25 Mar 2008 → 28 Mar 2008

Conference

Conference	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2008: Materials Research Society Symposium
City	San Francisco, California
Period	25/03/08 → 28/03/08

NREL Publication Number

NREL/CP-520-43004

Keywords

capacitance
grain boundaries
materials
microscopy
silicon
thin films

Cite this

@conference{76160ddff8b9479982c58e39af61515d,

title = "Probing Carrier Depletion on Grain Boundaries in Polycrystalline Si Thin Films by Scanning Capacitance Microscopy: Paper No. 1066-A04-02",

keywords = "capacitance, grain boundaries, materials, microscopy, silicon, thin films",

author = "Jiang, {Chun Sheng}",

year = "2008",

language = "American English",

pages = "87--92",

note = "Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2008: Materials Research Society Symposium ; Conference date: 25-03-2008 Through 28-03-2008",

}

Probing Carrier Depletion on Grain Boundaries in Polycrystalline Si Thin Films by Scanning Capacitance Microscopy: Paper No. 1066-A04-02. / Jiang, Chun Sheng.
2008. 87-92 Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2008: Materials Research Society Symposium, San Francisco, California.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Probing Carrier Depletion on Grain Boundaries in Polycrystalline Si Thin Films by Scanning Capacitance Microscopy

T2 - Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2008: Materials Research Society Symposium

AU - Jiang, Chun Sheng

PY - 2008

Y1 - 2008

KW - capacitance

KW - grain boundaries

KW - materials

KW - microscopy

KW - silicon

KW - thin films

M3 - Paper

SP - 87

EP - 92

Y2 - 25 March 2008 through 28 March 2008

ER -