PV Reliability Determination from I-V Measurement and Analysis

Keith Emery

doi:10.1117/12.795965

PV Reliability Determination from I-V Measurement and Analysis

Keith Emery

Chemistry and Nanoscience

Research output: Contribution to conference › Paper › peer-review

Abstract

We discuss the measurement and analysis of current vs. voltage (I-V) characteristics of photovoltaic (PV) cells and modules for reliability determination. We discuss both the error sources in the measurements and the strategies to minimize their influence. These error sources include the sample area, spectral errors, temperature fluctuations, current and voltage response time, contacting, and degradation during testing issues. Information that can be extracted from light and dark I-V includes peak power, open-circuit voltage, short-circuit current, series and shunt resistance, diode quality factor, dark current, and photo-current. The quantum efficiency provides information on photo-current nonlinearities, current generation and recombination mechanisms.

Original language	American English
Number of pages	7
DOIs	https://doi.org/10.1117/12.795965 https://doi.org/10.1117/12.795965
State	Published - 2008
Event	Reliability of Photovoltaic Cells, Modules, Components, and Systems - San Diego, CA, United States Duration: 11 Aug 2008 → 13 Aug 2008

Conference

Conference	Reliability of Photovoltaic Cells, Modules, Components, and Systems
Country/Territory	United States
City	San Diego, CA
Period	11/08/08 → 13/08/08

NREL Publication Number

NREL/CP-520-43640

Keywords

Efficiency
Photovoltaic
Solar cell

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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T1 - PV Reliability Determination from I-V Measurement and Analysis

AU - Emery, Keith

PY - 2008

Y1 - 2008

N2 - We discuss the measurement and analysis of current vs. voltage (I-V) characteristics of photovoltaic (PV) cells and modules for reliability determination. We discuss both the error sources in the measurements and the strategies to minimize their influence. These error sources include the sample area, spectral errors, temperature fluctuations, current and voltage response time, contacting, and degradation during testing issues. Information that can be extracted from light and dark I-V includes peak power, open-circuit voltage, short-circuit current, series and shunt resistance, diode quality factor, dark current, and photo-current. The quantum efficiency provides information on photo-current nonlinearities, current generation and recombination mechanisms.

AB - We discuss the measurement and analysis of current vs. voltage (I-V) characteristics of photovoltaic (PV) cells and modules for reliability determination. We discuss both the error sources in the measurements and the strategies to minimize their influence. These error sources include the sample area, spectral errors, temperature fluctuations, current and voltage response time, contacting, and degradation during testing issues. Information that can be extracted from light and dark I-V includes peak power, open-circuit voltage, short-circuit current, series and shunt resistance, diode quality factor, dark current, and photo-current. The quantum efficiency provides information on photo-current nonlinearities, current generation and recombination mechanisms.

KW - Efficiency

KW - Photovoltaic

KW - Solar cell

UR - http://www.scopus.com/inward/record.url?scp=56249124264&partnerID=8YFLogxK

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DO - 10.1117/12.795965

M3 - Paper

AN - SCOPUS:56249124264

T2 - Reliability of Photovoltaic Cells, Modules, Components, and Systems

Y2 - 11 August 2008 through 13 August 2008

ER -

PV Reliability Determination from I-V Measurement and Analysis

Abstract

Conference

NREL Publication Number

Keywords

UN SDGs

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