Quantifying Soiling Loss Directly from PV Yield

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67 Scopus Citations

Abstract

Soiling of photovoltaic (PV) panels is typically quantified through the use of specialized sensors. Here, we describe and validate a method for estimating soiling loss experienced by PV systems directly from system yield without the need for precipitation data. The method, termed the stochastic rate and recovery (SRR) method, automatically detects soiling intervals in a dataset, then stochastically generates a sample of possible soiling profiles based on the observed characteristics of each interval. In this paper, we describe the method, validate it against soiling station measurements, and compare it with other PV-yield-based soiling estimation methods. The broader application of the SRR method will enable the fleet scale assessment of soiling loss to facilitate mitigation planning and risk assessment.

Original languageAmerican English
Pages (from-to)547-551
Number of pages5
JournalIEEE Journal of Photovoltaics
Volume8
Issue number2
DOIs
StatePublished - 2018

Bibliographical note

Publisher Copyright:
© 2011-2012 IEEE.

NREL Publication Number

  • NREL/JA-5J00-70668

Keywords

  • Field performance
  • Monte Carlo methods
  • photovoltaic cells
  • photovoltaic systems
  • soiling
  • solar energy
  • solarpanels
  • time series analysis

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