Quantifying the Effect of Metal-Rich Precipitates on Minority Carrier Diffusion Length in Multicrystalline Silicon Using Synchrotron-Based Spectrally Resolved X-Ray Beam-Induced Current: Article No. 044101

    Research output: Contribution to journalArticlepeer-review

    Original languageAmerican English
    Number of pages3
    JournalApplied Physics Letters
    Issue number4
    StatePublished - 2005

    NREL Publication Number

    • NREL/JA-520-38823

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