Abstract
A method is presented to quantify thermal fatigue in the CPV die-attach from meteorological data. A comparative study between cities demonstrates a signifi cant difference in the accumulated damage. These differences are most sensitive to the number of larger (ΔT) thermal cycles experienced for a location. The method is extended to create lifetime predictions based on accelerated test results. High frequency data (<1/ min) may be required to most accurately employ this method.
| Original language | American English |
|---|---|
| Pages (from-to) | 6-9 |
| Number of pages | 4 |
| Journal | Advancing Microelectronics |
| Volume | 38 |
| Issue number | 1 |
| State | Published - Jan 2011 |
NLR Publication Number
- NREL/JA-5200-49875
Keywords
- photovoltaic modules
- solar energy
- thermal fatigue