Quantitative Analysis of Graded Cu(In1-x,Gax)Se2 Thin Films by AES, ICP-OES, and EPMA

doi:10.1016/j.apsusc.2010.07.085

Quantitative Analysis of Graded Cu(In1-x,Gax)Se2 Thin Films by AES, ICP-OES, and EPMA

Research output: Contribution to journal › Article › peer-review

Original language	American English
Pages (from-to)	878-886
Number of pages	9
Journal	Applied Surface Science
Volume	257
Issue number	3
DOIs	https://doi.org/10.1016/j.apsusc.2010.07.085
State	Published - 2010

NREL Publication Number

NREL/JA-520-46989

Keywords

auger
CIGS
electron probe microanalysis
photovoltaics
solar

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10.1016/j.apsusc.2010.07.085

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title = "Quantitative Analysis of Graded Cu(In1-x,Gax)Se2 Thin Films by AES, ICP-OES, and EPMA",

keywords = "auger, CIGS, electron probe microanalysis, photovoltaics, solar",

author = "NREL",

year = "2010",

doi = "10.1016/j.apsusc.2010.07.085",

language = "American English",

volume = "257",

pages = "878--886",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

number = "3",

}

TY - JOUR

T1 - Quantitative Analysis of Graded Cu(In1-x,Gax)Se2 Thin Films by AES, ICP-OES, and EPMA

AU - NREL, null

PY - 2010

Y1 - 2010

KW - auger

KW - CIGS

KW - electron probe microanalysis

KW - photovoltaics

KW - solar

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U2 - 10.1016/j.apsusc.2010.07.085

DO - 10.1016/j.apsusc.2010.07.085

M3 - Article

SN - 0169-4332

VL - 257

SP - 878

EP - 886

JO - Applied Surface Science

JF - Applied Surface Science

IS - 3

ER -

Quantitative Analysis of Graded Cu(In1-x,Gax)Se2 Thin Films by AES, ICP-OES, and EPMA

NREL Publication Number

Keywords

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