Quantitative Analysis of Graded Cu(In1-x,Gax)Se2 Thin Films by AES, ICP-OES, and EPMA

Craig L. Perkins, Brian Egaas, Ingrid Repins, Bobby To

Research output: Contribution to journalArticlepeer-review

33 Scopus Citations

Fingerprint

Dive into the research topics of 'Quantitative Analysis of Graded Cu(In1-x,Gax)Se2 Thin Films by AES, ICP-OES, and EPMA'. Together they form a unique fingerprint.

Engineering

Material Science