Quantitative Study of the Effect of Non-Uniform Irradiance on Module Performance Combining EL and DLIT Imaging with Circuit Modeling

Tao Song, Steven Johnston, Dean Levi, Felix Fruhauf, Jan Bauer, Otwin Breitenstein

Research output: Contribution to conferencePaperpeer-review

Abstract

This paper presents a quantitative study of how the non-uniform irradiance from solar simulators and the often overlooked non-uniformities in modules (e.g. mismatched cell performance in a module, connection of cell strings, bypass diodes) affect the measurement accuracy in Si module power calibrations. By implementing spatial non-uniformity maps of solar simulators and experimental diode parameters of individual cells in a module to our circuit model, it enables a better understanding of the interaction of simulator irradiance non-uniformity with module imperfections in module power measurements. The comparison between simulation and experiment shows that with a nonuniform irradiance of 3%, the PMAX deviations could be as low as ∼0.5 % for good-quality Si modules, and 2% for poor-quality Si modules, confirming the sensitivity of module power calibrations to module properties.

Original languageAmerican English
Pages3618-3622
Number of pages5
DOIs
StatePublished - 26 Nov 2018
Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
Duration: 10 Jun 201815 Jun 2018

Conference

Conference7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
Country/TerritoryUnited States
CityWaikoloa Village
Period10/06/1815/06/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

NREL Publication Number

  • NREL/CP-5900-70852

Keywords

  • analytical models
  • calibration
  • imaging
  • integrated circuit modeling
  • power measurement
  • silicon
  • statistical analysis

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