Abstract
We report on the lattice matched quaternary alloy, ByGa1 -yAs1 -x Bix grown by molecular beam epitaxy at conditions conducive to bismuth incorporation. Incorporating a smaller atom (boron) along with the larger atom (bismuth) allows for a reduction of the epi-layer strain and lattice matching to GaAs for compositions of Bi:B≃1.3:1. The addition of boron flux does not significantly affect the bismuth incorporation and no change in the band gap energy is observed with increasing boron content. However, excess, non-substitutional boron is incorporated which leads to an increase in hole density, as well as an increase in the density of shallow in-gap states as observed by the loss of localization of photo-excited excitons.
Original language | American English |
---|---|
Pages (from-to) | 37-40 |
Number of pages | 4 |
Journal | Journal of Crystal Growth |
Volume | 351 |
Issue number | 1 |
DOIs | |
State | Published - 15 Jul 2012 |
NREL Publication Number
- NREL/JA-5900-54048
Keywords
- bismuth compounds
- molecular beam epitaxy
- solid solutions
- x-ray diffraction