Abstract
Photovoltaic (PV) installations heavily depend on connectors for efficient module and string interconnections without requiring skilled labor. Yet this seemingly innocuous component of PV systems is a leading cause of module failures, multiple high-profile fires, and lawsuits in the PV industry. This work aims to answer critical questions regarding why connectors fail and the contributing factors to their failure. The study involves collecting and analyzing more than 17,000 field-harvested connectors from various solar installations across the United States. The vast dataset, which includes connector metadata, visual inspections, and resistance measurements, provides unprecedented insight into the state of health of PV connectors across the US, including the geographic locations, connector types, and installation practices most prone to failures. The work presented here describes a novel rapid characterization method for processing large numbers of connectors and is supported by parallel forensic analysis to discern the root causes of failures as well as a levelized cost of lifetime model to determine the economic ramifications of connector failure. Ultimately, the findings may inform PV developers about the best practices to extend connector longevity and lead to more resilient and reliable PV systems.
Original language | American English |
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Pages | 1249-1252 |
Number of pages | 4 |
DOIs | |
State | Published - 2024 |
Event | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) - Seattle, Washington Duration: 9 Jun 2024 → 14 Jun 2024 |
Conference
Conference | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) |
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City | Seattle, Washington |
Period | 9/06/24 → 14/06/24 |
NREL Publication Number
- NREL/CP-7A40-92694
Keywords
- connectors
- degradation
- forensics
- industries
- photovoltaic systems
- reliability
- standardization
- statistical analysis
- terminology
- visualization