Rapid Characterization of Photovoltaic Materials Using Photoelectrochemical Techniques

S. R. Kurtz, J. M. Olson

Research output: Contribution to conferencePaperpeer-review

19 Scopus Citations


The development of a new materials technology for photovoltaic devices is often hindered by the lack of a rapid quantitative technique for measuring the photovoltaic quality of the new material as a function of growth parameters, doping levels and device processing procedures. Photoelectrochemical methods are shown to provide rapid quantitative characterization without the limitations of photoluminescence and other techniques. The short-circuit photoelectrochemical current is shown to be proportional to the short-circuit current of a solid-state photovoltaic device made from the same material. Electrolyte-semiconductor junctions are also used to measure the bandgap, carrier concentration and diffusion length.

Original languageAmerican English
Number of pages4
StatePublished - 1987
EventNineteenth IEEE Photovoltaic Specialists Conference-1987 - New Orleans, Louisiana
Duration: 4 May 19878 May 1987


ConferenceNineteenth IEEE Photovoltaic Specialists Conference-1987
CityNew Orleans, Louisiana

NREL Publication Number

  • ACNR/CP-212-9174


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