Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL

Tom Moriarty; Ryan France; Myles Steiner

doi:10.1109/PVSC.2015.7355845

Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL

Tom Moriarty, Ryan France, Myles Steiner

Chemistry and Nanoscience

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

2 Scopus Citations

Abstract

Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.

Original language	American English
Number of pages	3
DOIs	https://doi.org/10.1109/PVSC.2015.7355845 https://doi.org/10.1109/PVSC.2015.7355845
State	Published - 14 Dec 2015
Event	2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) - New Orleans, Louisiana Duration: 14 Jun 2015 → 19 Jun 2015

Conference

Conference	2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
City	New Orleans, Louisiana
Period	14/06/15 → 19/06/15

Bibliographical note

See NREL/CP-5J00-64416 for preprint

NREL Publication Number

NREL/CP-5J00-66366

Keywords

characterization
IV
multi-junction

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@conference{7695b9df3e26454c9cf6279977d664e6,

title = "Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL",

abstract = "Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.",

keywords = "characterization, IV, multi-junction",

author = "Tom Moriarty and Ryan France and Myles Steiner",

note = "See NREL/CP-5J00-64416 for preprint; 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) ; Conference date: 14-06-2015 Through 19-06-2015",

year = "2015",

month = dec,

day = "14",

doi = "10.1109/PVSC.2015.7355845",

language = "American English",

}

TY - CONF

T1 - Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL

AU - Moriarty, Tom

AU - France, Ryan

AU - Steiner, Myles

N1 - See NREL/CP-5J00-64416 for preprint

PY - 2015/12/14

Y1 - 2015/12/14

N2 - Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.

AB - Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.

KW - characterization

KW - IV

KW - multi-junction

UR - http://www.scopus.com/inward/record.url?scp=84961644593&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2015.7355845

DO - 10.1109/PVSC.2015.7355845

M3 - Paper

AN - SCOPUS:84961644593

T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)

Y2 - 14 June 2015 through 19 June 2015

ER -

Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

Access to Document

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Cite this