Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint

Ryan France; Myles Steiner

Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint

Chemistry and Nanoscience

Research output: Contribution to conference › Paper

Abstract

Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.

Original language	American English
Number of pages	5
State	Published - 2015
Event	42nd IEEE Photovoltaic Specialists Conference - New Orleans, Louisiana Duration: 14 Jun 2015 → 19 Jun 2015

Conference

Conference	42nd IEEE Photovoltaic Specialists Conference
City	New Orleans, Louisiana
Period	14/06/15 → 19/06/15

NLR Publication Number

NREL/CP-5J00-64416

Keywords

characterizations
IV
multi-junction

Access to Document

https://www.nrel.gov/docs/fy15osti/64416.pdf

Cite this

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title = "Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint",

abstract = "Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.",

keywords = "characterizations, IV, multi-junction",

author = "Ryan France and Myles Steiner",

year = "2015",

language = "American English",

note = "42nd IEEE Photovoltaic Specialists Conference ; Conference date: 14-06-2015 Through 19-06-2015",

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TY - CONF

T1 - Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint

AU - France, Ryan

AU - Steiner, Myles

PY - 2015

Y1 - 2015

N2 - Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.

AB - Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.

KW - characterizations

KW - IV

KW - multi-junction

M3 - Paper

T2 - 42nd IEEE Photovoltaic Specialists Conference

Y2 - 14 June 2015 through 19 June 2015

ER -

Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint

Abstract

Conference

NLR Publication Number

Keywords

Access to Document

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Cite this