Real-Time Spectroscopic Ellipsometry as an In-Situ Probe of the Growth Dynamics of Amorphous and Epitaxial Crystal Silicon for Photovoltaic Applications

Dean Levi

Real-Time Spectroscopic Ellipsometry as an In-Situ Probe of the Growth Dynamics of Amorphous and Epitaxial Crystal Silicon for Photovoltaic Applications

Dean Levi

Chemistry and Nanoscience

Research output: Contribution to conference › Paper

Original language	American English
Pages	159-170
Number of pages	12
State	Published - 2005
Event	Amorphous and Nanocrystalline Silicon Science and Technology 2005: Materials Research Society Symposium - San Francisco, California Duration: 28 Mar 2005 → 1 Apr 2005

Conference

Conference	Amorphous and Nanocrystalline Silicon Science and Technology 2005: Materials Research Society Symposium
City	San Francisco, California
Period	28/03/05 → 1/04/05

NREL Publication Number

NREL/CP-520-37876

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

@conference{1a121a0a81ac4f628e3b62bbbac61b76,

title = "Real-Time Spectroscopic Ellipsometry as an In-Situ Probe of the Growth Dynamics of Amorphous and Epitaxial Crystal Silicon for Photovoltaic Applications",

author = "Dean Levi",

year = "2005",

language = "American English",

pages = "159--170",

note = "Amorphous and Nanocrystalline Silicon Science and Technology 2005: Materials Research Society Symposium ; Conference date: 28-03-2005 Through 01-04-2005",

}

Real-Time Spectroscopic Ellipsometry as an In-Situ Probe of the Growth Dynamics of Amorphous and Epitaxial Crystal Silicon for Photovoltaic Applications. / Levi, Dean.
2005. 159-170 Paper presented at Amorphous and Nanocrystalline Silicon Science and Technology 2005: Materials Research Society Symposium, San Francisco, California.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Real-Time Spectroscopic Ellipsometry as an In-Situ Probe of the Growth Dynamics of Amorphous and Epitaxial Crystal Silicon for Photovoltaic Applications

AU - Levi, Dean

PY - 2005

Y1 - 2005

M3 - Paper

SP - 159

EP - 170

T2 - Amorphous and Nanocrystalline Silicon Science and Technology 2005: Materials Research Society Symposium

Y2 - 28 March 2005 through 1 April 2005

ER -