Recombination Effects at Oxygen Related Double Acceptors in Al0.10Ga0.90As

R. K. Ahrenkiel, J. Zhang, B. M. Keyes, S. E. Asher, M. L. Timmons

Research output: Contribution to conferencePaperpeer-review

1 Scopus Citations

Abstract

This work shows that the hole lifetime of n-type Al0.10Ga0.90 As is controlled by impurity-oxygen-related recombination centers with capture cross sections of about 1012 cm2 when the films are grown at temperatures of 720°C and lower. Correlated time-resolved photoluminescence and deep level transient spectroscopy measurements link these centers to well known impurity oxygen complexes. Film growth at temperatures above about 720°C eliminates these oxygen complexes from the epitaxial layer resulting in greatly improved photovoltaic properties.

Original languageAmerican English
Pages712-716
Number of pages5
StatePublished - 1993
EventProceedings of the 23rd IEEE Photovoltaic Specialists Conference - Louisville, KY, USA
Duration: 10 May 199314 May 1993

Conference

ConferenceProceedings of the 23rd IEEE Photovoltaic Specialists Conference
CityLouisville, KY, USA
Period10/05/9314/05/93

NREL Publication Number

  • ACNR/CP-412-13601

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