Abstract
This paper describes the large concentration of 60..deg.. <111> twin boundaries that was observed in every CdTe film analyzed in this work, even after recrystallization and grain growth, confirming the low energy of these interfaces.
| Original language | American English |
|---|---|
| Number of pages | 8 |
| State | Published - 2008 |
| Event | 33rd IEEE Photovoltaic Specialists Conference - San Diego, California Duration: 11 May 2008 → 16 May 2008 |
Conference
| Conference | 33rd IEEE Photovoltaic Specialists Conference |
|---|---|
| City | San Diego, California |
| Period | 11/05/08 → 16/05/08 |
NLR Publication Number
- NREL/CP-520-42512
Keywords
- CdTe
- close-space sublimation (CSS)
- electro-optical properties
- electron backscatter diffraction
- grain-growth process
- ion-beam milling
- physical vapor deposition
- PV
- recrystallization
- thin films