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Relationship of Open-Circuit Voltage to CdTe Hole Concentration and Lifetime
Joel Duenow, David Albin, Matthew Reese, Steven Johnston, Darius Kuciauskas, Wyatt Metzger, Santosh Swain, Tursun Ablekim, Kelvin Lynn, Alan Fahrenbruch, James Burst
Research output: Contribution to journal › Article › peer-review
32
Scopus Citations