Relationship of Open-Circuit Voltage to CdTe Hole Concentration and Lifetime

Joel Duenow, David Albin, Matthew Reese, Steven Johnston, Darius Kuciauskas, Wyatt Metzger, Santosh Swain, Tursun Ablekim, Kelvin Lynn, Alan Fahrenbruch, James Burst

Research output: Contribution to journalArticlepeer-review

29 Scopus Citations

Fingerprint

Dive into the research topics of 'Relationship of Open-Circuit Voltage to CdTe Hole Concentration and Lifetime'. Together they form a unique fingerprint.

Engineering