Relative Lifetime Prediction for CPV Die-Attach Layers: Preprint

Research output: Contribution to conferencePaper


In concentrating photovoltaics (CPV) cell assemblies, a large-area die-attach layer is subjected to thermal cycles, leading to thermomechanical fatigue. This causes cracking and the eventual failure of the CPV cell by thermal runaway. We define a damage metric representing lumped progress toward failure and present a numerical model for computing the accumulation of damage for arbitrary transienttemperature conditions. The model is applied to a particular design with a solder die-attach layer. We show that accelerated-test thermal cycles with higher ramp rates cause more damage, both per cycle and per unit time. Outdoor exposure to one entire year in two geographic locations is also simulated, revealing that a year of exposure in Golden, Colorado is equivalent to 1.4 years of exposurein Oak Ridge, Tennessee.
Original languageAmerican English
Number of pages10
StatePublished - 2012
Event2012 IEEE International Reliability Physics Symposium - Anaheim, California
Duration: 15 Apr 201217 Apr 2012


Conference2012 IEEE International Reliability Physics Symposium
CityAnaheim, California

NREL Publication Number

  • NREL/CP-5200-54332


  • concentrating photovoltaics
  • finite-element model
  • lifetime prediction
  • solder
  • solid mechanics


Dive into the research topics of 'Relative Lifetime Prediction for CPV Die-Attach Layers: Preprint'. Together they form a unique fingerprint.

Cite this