Reliability Issues for Photovoltaic Modules (Presentation)

Research output: NRELPresentation


Si modules good in field; new designs need reliability testing. CdTe & CIGS modules sensitive to moisture; carefully seal. CPV in product development stage; benefits from expertise in other industries.
Original languageAmerican English
Number of pages38
StatePublished - 2009

Publication series

NamePresented at the IEEE ASTR Conference, 7-9 October 2009, Jersey City, New Jersey

NREL Publication Number

  • NREL/PR-520-46481


  • concentrator
  • crystalline silicon (x-Si) (c-Si)
  • modules
  • PV
  • reliability
  • solar thermal
  • thin films


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