Reliability of MINP Compared to MIS, SIS, and N/P Silicon Solar Cells Under 1.0-MeV Electron and Environmental Effects

doi:10.1109/T-ED.1984.21578

Reliability of MINP Compared to MIS, SIS, and N/P Silicon Solar Cells Under 1.0-MeV Electron and Environmental Effects

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	619-621
Number of pages	3
Journal	IEEE Transactions on Electron Devices
Volume	ED-31
Issue number	5
DOIs	https://doi.org/10.1109/T-ED.1984.21578
State	Published - 1984

Bibliographical note

Work performed by Western New York Nuclear Technology Center and Department of Electrical Engineering, State University of New York at Buffalo, Amherst, New York

NREL Publication Number

ACNR/JA-3659

Access to Document

10.1109/T-ED.1984.21578

Cite this

@article{e98903c5eb4e46a1ae690c4a7434964d,

title = "Reliability of MINP Compared to MIS, SIS, and N/P Silicon Solar Cells Under 1.0-MeV Electron and Environmental Effects",

author = "NREL",

note = "Work performed by Western New York Nuclear Technology Center and Department of Electrical Engineering, State University of New York at Buffalo, Amherst, New York",

year = "1984",

doi = "10.1109/T-ED.1984.21578",

language = "American English",

volume = "ED-31",

pages = "619--621",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5",

}

TY - JOUR

T1 - Reliability of MINP Compared to MIS, SIS, and N/P Silicon Solar Cells Under 1.0-MeV Electron and Environmental Effects

AU - NREL, null

N1 - Work performed by Western New York Nuclear Technology Center and Department of Electrical Engineering, State University of New York at Buffalo, Amherst, New York

PY - 1984

Y1 - 1984

U2 - 10.1109/T-ED.1984.21578

DO - 10.1109/T-ED.1984.21578

M3 - Article

SN - 0018-9383

VL - ED-31

SP - 619

EP - 621

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 5

ER -