Reliability of MINP Compared to MIS, SIS, and N/P Silicon Solar Cells Under 1.0-MeV Electron and Environmental Effects

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)619-621
    Number of pages3
    JournalIEEE Transactions on Electron Devices
    Issue number5
    StatePublished - 1984

    Bibliographical note

    Work performed by Western New York Nuclear Technology Center and Department of Electrical Engineering, State University of New York at Buffalo, Amherst, New York

    NREL Publication Number

    • ACNR/JA-3659

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