@misc{0bb667bb5fd64433b5e010acc8270462,
title = "Reliability of TOPCon Solar Cells: Understanding Degradation and Recovery of Poly-Si/SiOx Passivating Contacts",
abstract = "A presentation recommending that TOPCon modules and/or cells should have surface passive degradation tests performed, and should be treated with surface passivation recovery.",
keywords = "accelerated recovery, annealing temperature, degradation, passivating contact, photovoltaic, poly-Si/SiOx, PV, silicon, solar cell, TOPCon",
author = "Aditya Ratnapagol and Sumit Agarwal and William Nemeth and Paul Stradins and David Young",
year = "2025",
doi = "10.2172/2584562",
language = "American English",
series = "Presented at the Photovoltaic Reliability Workshop (PVRW), 4-6 March 2025, Golden, Colorado",
type = "Other",
}