Reliability Testing Beyond Qualification as a Key Component in Photovoltaic's Progress Toward Grid Parity: Preprint

    Research output: Contribution to conferencePaper

    Abstract

    This paper discusses why it is necessary for new lower cost PV modules to be tested using a reliability test sequence that goes beyond the Qualification test sequence now utilized for modules. Today most PV modules are warranted for 25 years, but the Qualification Test Sequence does not test for 25-year life. There is no accepted test protocol to validate a 25-year lifetime. This paper recommendsthe use of long term accelerated testing to compare now designs directly with older designs that have achieved long lifetimes in outdoor exposure. If the new designs do as well or better than the older ones, then it is likely that they will survive an equivalent length of time in the field.
    Original languageAmerican English
    Number of pages9
    StatePublished - 2011
    EventIEEE International Reliability Physics Symposium - Monterey, California
    Duration: 10 Apr 201114 Apr 2011

    Conference

    ConferenceIEEE International Reliability Physics Symposium
    CityMonterey, California
    Period10/04/1114/04/11

    NREL Publication Number

    • NREL/CP-5200-50599

    Keywords

    • grid parity
    • LCOE
    • levelized cost of electricity
    • photovoltaic module reliability
    • qualification testing
    • reliability testing

    Fingerprint

    Dive into the research topics of 'Reliability Testing Beyond Qualification as a Key Component in Photovoltaic's Progress Toward Grid Parity: Preprint'. Together they form a unique fingerprint.

    Cite this