Reliability Testing Beyond Qualification as a Key Component in Photovoltaic's Progress Toward Grid Parity

John H. Wohlgemuth, Sarah Kurtz

Research output: Contribution to conferencePaperpeer-review

60 Scopus Citations

Abstract

This paper discusses why it is necessary for new lower cost PV modules to be tested using a reliability test sequence that goes beyond the Qualification test sequence now utilized for modules. Today most PV modules are warranted for 25 years, but the Qualification Test Sequence does not test for 25-year life. There is no accepted test protocol to validate a 25-year lifetime. This paper recommends the use of long term accelerated testing to compare now designs directly with older designs that have achieved long lifetimes in outdoor exposure. If the new designs do as well or better than the older ones, then it is likely that they will survive an equivalent length of time in the field.

Original languageAmerican English
Pages5E.3.1-5E.3.6
Number of pages6
DOIs
StatePublished - 2011
Event49th International Reliability Physics Symposium, IRPS 2011 - Monterey, CA, United States
Duration: 10 Apr 201114 Apr 2011

Conference

Conference49th International Reliability Physics Symposium, IRPS 2011
Country/TerritoryUnited States
CityMonterey, CA
Period10/04/1114/04/11

NREL Publication Number

  • NREL/CP-5200-52150

Keywords

  • Grid Parity
  • Levelized Cost of Electricity (LCOE)
  • Photovoltaic module reliability
  • Qualification Testing
  • Reliability Testing

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