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Removal of Stacking Faults in Ge Grown on Si Through Nanoscale Openings in Chemical SiO(2)
Darin Leonhardt, Josephine Sheng, Jeffrey G. Cederberg, Malcolm S. Carroll, Qiming Li, Manual J. Romero, Darius Kuciauskas, Daniel J. Friedman, Sang M. Han
Research output: Contribution to journal › Article › peer-review
2
Scopus Citations