Removing Grain Boundary Effects in Polycrystalline Silicon Using a Minority Carrier Mirror Concept

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Number of pages6
    StatePublished - 1984
    EventThin Films and Interfaces II: Symposium - Boston, Massachusetts
    Duration: 1 Nov 19831 Nov 1983


    ConferenceThin Films and Interfaces II: Symposium
    CityBoston, Massachusetts

    Bibliographical note

    Work performed by Department of Electrical and Computer Engineering, State University of New York at Buffalo, Amherst, New York

    NREL Publication Number

    • ACNR/CP-3573

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